The ergonomic design and cutting-edge optics of the Achios-X Observer make it the perfect choice for advanced materials science applications. With 22 mm field of view eyepieces, semi-pan apochromatic and plan apochromatic objectives, the Achios-X Observer delivers exceptional color fidelity and high-resolution imaging for precise and reliable observations for Materials science applications
o = Optional
EYEPIECES
EWF 10x/22 mm eyepiece, with diopter adjustment, Ø 30 mm
HEADS
NOSEPIECE
OBJECTIVES - BRIGHTFIELD/DARKFIELD
Plan Semi-Apo (PL-SAMi) |
5x/0.15, WD 20 mm |
10x/0.30, WD 11 mm |
20x/0.45, WD 3.1 mm |
||
Plan Apo (PL-AMi) |
50x/0.80, WD 1 mm |
100x/0.90, WD 1 mm* |
* Optional
All objectives are IOS 45 mm parafocal and have a M26 mm mounting thread.
All optics are anti-fungus treated and anti-reflection coated for maximum light throughput
STAGE
FOCUSING
Coarse travel 18 mm, fine adjustment 0.2 mm per rotation with 0.002 mm divisions
ILLUMINATION
LIGHT AND COLOR TEMPERATURE CONTROL
This intelligent feature memorizes the light intensity level for each objective. The color temperature of the NeoLED light source can be adjusted and stored. This innovation not only heightens comfort but also saves valuable time during routine magnification shifts. The eco-friendly NeoLED light source is both environmentally conscious and built to endure. The sleep function switches the light source off, after a user definable time laps
NeoLED
The innovative NeoLED™ design is a combination of a custom LED and a specially designed thin lens with a short focal length in order to:
LONG WORKING DISTANCE CONDENSER
In height adjustable long working distance N.A. 0.65 condenser with numerical aperture identification marks
POLARIZATION
The microscope comes with an analyzer and a polarizer, which can easily be inserted into the free slots of the Epi-Illuminator
DIFFERENTIAL INTERFERENCE CONTRAST (DIC)*
The DIC-module shows differences in height of structures, which - ordinarily - cannot be displayed using only brightfield technique. These relief-like images are ideal for surface inspections of wafers, LCD screens etc.
* Optional
CSS – CABLE STORAGE SYSTEM
Allows users to easily stow away excess cable length onto the back of the instrument during operation, and to roll up the power cable for easy storage
CARRYING GRIP
The integrated carrying grip at the back of the microscope ensures safe transportation of the microscope
PACKAGING
Supplied with power cord, analyzer, polarizer, dust cover, a spare fuse, user manual and universal tool. All packed in a polystyrene box